Navigation: Tools Commands > Analyze Scatter Importance Sampling

 

Analyze Scatter Importance Sampling

 

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Description


This tool computes the efficiency of an importance sampling specification by firing rays from a designated scattering surface towards the importance sampling region.

 

 

Navigation


This feature can be accessed by selecting Tools > Analyze Scatter Importance Sampling from the menu.

 

 

Controls


Control

Inputs / Description

Defaults

"Detector" Surface to Scatter Toward

Identifies which surface will be identified as the collection surface.

The first surface found in the tree with a scatter direction assigned.

Important Sampled Surfaces (analyze all checked)

Test

Toggles surface for testing.  This surface will have rays scattered from it according to its scattering and importance sampling definitions.

Unchecked

# Rays

Number of test rays to intersect with the scattering surface.  Surface intersection positions are randomized.  The total number of rays traced will be (# Rays) x (# Scatter rays in importance sampling specification).

10

 

Material

Specify ray immersion material from current catalog.

Air

Surface

Scattering surface name.

Surfaces with scattering directions assigned.

Wavelengths

Active

Toggles wavelength on or off.

Unchecked

Wavelens (mm)

Wavelength of analysis rays.

0.5892938 mm

Weights

Power weight of wavelength.

1

Ray Color

Sets the analysis ray color for visualization.

Black

 

Print efficiency results to the text window

When checked, prints the results to the output window.

Checked

Draw the rays used to compute the efficiency

When checked, draws the rays used in the calculation in the visualization window.

Unchecked

 

Analyze and Close

Perform analysis and close dialog box.

 

Close

Discard settings and close dialog box.

 

Analyze

Perform analysis and keep dialog box open.

 

Help

Access this Help page.

 

 

 

Related Topics


Determine Scatter Importance Sampling

Tools Menu Summary

 

 

 

 

 

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