Tools - Determine Scatter Importance Sampling

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Determine Scatter Importance Sampling

Page Contents

Description

This feature computes the size, centroid location and mean direction of an Importance Ellipsoid towards which rays should be scattered from selected scattering entities in order to reach a specified “detector” surface. If directed, FRED will add an Importance Ellipsoid to the “Scatter Direction Region(s) of Interest” of each scattering surface. FRED is also capable of finding multiple paths to the “detector” if requested and results can optionally be printed to the output Window.

Navigation

This feature can be accessed by selecting Tools > Determine Scatter Importance Sampling from the menu.

Controls

Control	Inputs / Description	Defaults
Scatter to the Specified Detector
"Detector" Surface to Scatter Toward	Surface chosen from dropdown list.	The first surface found in the tree that has a Scatter Direction assigned.
Immersion Material	Material chosen from dropdown list.	Air
# of Rays to Emit per surface	Select number of rays to use for calculation.	5000
Emit Rays Forward	Emit in the forward direction.	Checked
Emit Rays Backward	Emit in the backward direction.	Checked
Wavelengths	Select emitter wavelength, weight and ray color.	0.5892938
Scatter from the Specified Surfaces
Print Computed Information	Print computed data to output window.	Unchecked
also print ray paths	Print path data to output window.	Unchecked
Draw the rays used to compute the importance sampling	Show rays being traced during calculation.	Unchecked
Replace old importance samples with the new ones	Replace old importance edge with newly computed importance edge. Leave unchecked to add new importance edge to existing list.	Checked

Compute and Close	Compute Scatter Importance Sampling and close dialog box.
Close	Discard settings and close dialog box.
Compute	Compute Scatter Importance Sampling and keep dialog box open.
Help	Access this Help page.