This command prints to the output window data pertaining to power incident or absorbed on surfaces (including Detector Entities other than the 3D Box) in the FRED model.
The following information is printed:
This command can be accessed in the following ways: •Menu > Analyses > Surface Incident / Absorbed Power •Ctrl + Shift + S •Toolbar button:
Power becomes lost when rays are not allowed to trace due to raytrace controls. E.g. if the physics of a surface coating would permit, say, a reflected and and a transmitted ray, but the raytrace control only allows a transmitted ray, then in this case the reflected power that was not allowed to trace is considered lost on that surface.
When rays undergo a surface interaction, rays whose ancestry level is greater than the raytrace control ancestry level cutoffs actually do get temporarily created (and are later removed). During this intermediate stage in the ray interaction process, the temporary rays' power is subtracted from the incident power when the absorbed power calculation is being made. Therefore, the absorbed power value reported in the Surface Incident / Absorbed Power output will not vary as you change the ancestry cutoff threshold settings in the raytrace controls.
Absorbed Power and Scatter TIS The value reported for absorbed (or lost) power is insensitive to the specific importance sampling specifications applied to the surface for ray-based sampling of a scattered light distribution. Radiated power as a result of surface scattering is accounted for in the surface incident/absorbed power analysis by calculating a total integrated scatter (TIS) value for each incident ray (at it's appropriate angle of incidence). In this way, the absorbed power does not have a dependence on the ray sampling of the scattered light distribution.
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