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Coherence Tab

 

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Description


FRED performs diffraction and interference calculations using a technique called coherent beam superposition.   The coherent beam superposition technique works by modeling arbitrary optical fields with the coherent summation of smaller fundamental beams.   In FRED, these smaller fundamental beams are generally astigmatic Gaussian beamlets.  It was demonstrated by J. Arnaud that Gaussian beams could be represented and propagated with real rays.  Those real rays can be traced through an optical system while maintaining the Gaussian beam representation.   The near and far field diffraction patterns can be calculated coherently summing the Gaussian beams, which are represented by real rays traced through the system.

 

If the Source is set as coherent on the Coherence page, then each of the ray positions defined in the source becomes a Gaussian beamlet that is represented by two, four, or eight secondary real rays.  In addition to choosing the number of secondary rays, the overlap of the adjacent beam overlap factor, and the secondary beam scaling can be set on the Coherence page.

 

 

Navigation


This feature can be accessed by selecting the Coherence tab from a Detailed Source dialog box.

 

 

Controls


Control

Inputs / Description

Defaults

Coherent/Not Coherent

If the coherent option is selected, then the ray positions defined in the source become Gaussian beamlets represented with 2, 4, or 8 secondary real rays.

Not Coherent

Gaussian Beam Properties

Adjacent Beams Overlap Factor

The fractional overlap of adjacent Gaussian beamlets.  This factor changes the waist diameter of the Gaussian beamlets.  Typical value between 1.4 and 1.6. 

1.5

Number of Secondary Rays

Pull down menu of available options for the number of secondary real rays representing the Gaussian beamlets.  The use of 8 beamlets is generally recommended.

2 Beamlets

One waist and one divergence ray are used to propagate a symmetric beamlet.

4 Beamlets

Two waist rays (one X and one Y) and two divergence rays (one X and one Y) are used to propagate an elliptical beamlet.

8 Beamlets

Four waist rays (+X, -X, +Y and -Y) and four divergence rays (+X, -X, +Y and -Y) are used to propagate an elliptical beamlet.  When the Gaussian field is reconstructed from the secondary rays, the +/- components of each direction are averaged together.  While not required in order to represent the elliptical Gaussian beam, the averaging process results in beamlets which are less prone to errors from localized non-quadratic surface profiles.

8

Secondary Ray Scale Factor

This is an advanced feature that scales the secondary rays representing the Gaussian beamlets.

1

Number of Sample Points for Coherent Source Power Scaling

Field sample points in X and Y

Grid resolution (pixels count) of the internal irradiance grid used to set the coherent source power.  See the coherent source power scaling application note.

49, 49

Spatial sample plane size scaling in X and Y

Relative size scaling of the internal irradiance grid used to set the coherent source power.  See the coherent source power scaling application note.

1, 1

 

OK

Accept settings and close dialog box.

 

Cancel

Discard settings and close dialog box.

 

Apply

Accept settings and keep dialog box open.

 

Help

Access this Help page.

 

 

 

Application Notes


Coherent Source Power Scaling

The Number of Sample Points for Coherent Source Power Scaling controls on the Coherence tab of a detailed source address specific scenarios in which the algorithm used to set the total power of a coherent source fails to converge on the requested value.  When a coherent source is created, the following steps are taken:

 

1.

An initial rayset is created.

2.

An internal irradiance calculation is performed on the source with the initial rayset and the total power in the irradiance distribution is determined.

3.

The final rayset is created by scaling the fluxes of the rays in the initial rayset by the ratio of the user-requested source power and the total power from (2).

 

An irradiance distribution requires an area over which the calculation is performed and a grid resolution (number of pixels) over that area.  The "Field sample points in X and Y" controls allow the user to specify the grid resolution of the internal irradiance calculation and these controls are sufficient for being able to achieve the correct coherent source power scaling in most cases.  The area over which the irradiance calculation is performed is controlled by the "Spatial sample plane size scaling in X and Y" settings.  The default size of the internal irradiance grid used in step (2) above is determined by the maximum extend of the secondary rays in the initial rayset.  This default size can be determined by performing a gaussian ray size spot diagram at the source location and looking at the extents of the resulting plot window.

 

The scenario in which the default size of the internal irradiance grid is insufficient occurs when the extent of the secondary rays is significantly larger than the spatial extent of the irradiance distribution itself. In such a case, the default size of the internal irradiance grid will potentially have insufficient spatial resolution over the area of the power distribution to recover an accurate scale factor for the ray fluxes.  The most common case that may encounter this scenario is a point source.

 

How do you know when you need to use these scale factor settings?  With coherent sources, it is always good practice to perform an irradiance calculation on the source alone (prior to propagation, at the source position), since it will allow you to confirm that the spatial distribution at the source plane matches the requested specifications supplied to the source dialog and that the total integrated power in the distribution matches the requested source power.  When the total integrated power returned by the irradiance calculation does not match the requested power, consider adjusting the spatial scale factor parameters if you are defining a point source.

 

 

Related Topics


Detailed Sources

 

 

 

 

 

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